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On testing of Uniform Samplers

On testing of Uniform Samplers.
Sourav Chakraborty, and Kuldeep S. Meel.
In Proceedings of AAAI Conference on Artificial Intelligence (AAAI), January 2019.

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Abstract

Recent years have seen an unprecedented adoption of artificial intelligence in wide variety of applications ranging from medical diagnosis, automobile, security to aircraft collision avoidance. Probabilistic reasoning is a key component of such modern artificial intelligence systems. Sampling techniques form the core of the state of the art probabilistic reasoning systems. In contrast to testing for deterministic programs, where one trace is sufficient to prove the existence of a bug; such is not the case for samplers as one sample is typically not sufficient to prove non-conformity of the sampler to the desired distribution. This makes one wonder: whether it is possible to design testing methodology to test whether a sampler under test generates samples close to a given distribution. The primary contribution of this paper is a positive answer to the above question: We design, to the best of our knowledge, the first algorithmic framework, Barbarik, to test whether the distribution generated by $\varepsilon-$close or $\eta-$far from the uniform distribution. In contrast to the sampling techniques that require an exponential or sub-exponential number of samples for sampler whose support can be represented by $n$ bits, Barbarik requires only $\mathcalO(1/(\eta-\varepsilon)^2)$ samples. We present a prototype implementation of Barbarik and use it to test three state of the art uniform samplers over the support defined by combinatorial constraints. Barbarik is able to provide a certificate of uniformity to one sampler and demonstrate non-uniformity for the other two samplers.

BibTeX

@inproceedings{CM19,
  author={Chakraborty, Sourav and Meel, Kuldeep S.},
  title={On testing of Uniform Samplers},
  bib2html_pubtype={Refereed Conference},
  booktitle=AAAI,
  bib2html_dl_pdf={../Papers/aaai19-cm.pdf},
  month=jan,
  year={2019},
  bib2html_rescat={Distribution Testing, Sampling},
  code={https://github.com/meelgroup/barbarik},
  abstract={
    Recent years have seen an unprecedented adoption of artificial intelligence
    in wide variety of applications ranging from medical diagnosis, automobile,
    security to aircraft collision avoidance. Probabilistic reasoning is a key
    component of such modern artificial intelligence systems. Sampling
    techniques form the core of the state of the art probabilistic reasoning
    systems. In contrast to testing for deterministic programs, where one trace
    is sufficient to prove the existence of a bug; such is not the case for
    samplers as one sample is typically not sufficient to prove non-conformity
    of the sampler to the desired distribution. This makes one wonder: whether
    it is possible to design testing methodology to test whether a sampler under
    test generates samples close to a given distribution.
    The primary contribution of this paper is a positive answer to the above
    question: We design, to the best of our knowledge, the first algorithmic
    framework, Barbarik, to test whether the distribution generated by
    $\varepsilon-$close or $\eta-$far from the uniform distribution. In contrast
    to the sampling techniques that require an exponential or sub-exponential
    number of samples for sampler whose support can be represented by $n$ bits,
    Barbarik requires only $\mathcal{O}(1/(\eta-\varepsilon)^2)$ samples. We
    present a prototype implementation of Barbarik and use it to test three
    state of the art uniform samplers over the support defined by combinatorial
    constraints. Barbarik is able to provide a certificate of uniformity to one
    sampler and demonstrate non-uniformity for the other two samplers.
  },
}

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