Polynomial Identity Testing
Here is an handout for the talk I gave in the Theory Student Seminar: Depth and rank considerations in the Polynomial Identity Problem.
I try to keep on this page a list of papers and surveys on the Polynomial Identity Testing problem. I do not know all the papers on this topic, so you can help me by sending me an email with references: ens-lyon.fr@Bruno.Grenet (reverse order).
For each paper, I give a link to an online PDF version of the paper. If possible, I give a link to ECCC or the ArXiV. Else I try to find the paper on one of the authors' webpage. If none of the previous solutions is possible, I nevertheless give a link where the paper is freely available.
Please let me know about any broken link.
Surveys
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N. Saxena.
Progress on Polynomial Identity Testing.
Bull. EATCS, 99:49-79, 2009.
[ bib |
pdf ]
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M. Agrawal and R. Saptharishi.
Classifying Polynomials and Identity Testing.
2009.
[ bib |
pdf ]
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M. Agrawal.
Proving Lower Bounds Via Pseudo-random Generators.
In Proc. FSTTCS'05, page 92. Springer-Verlag New York Inc,
2005.
[ bib |
pdf ]
Deterministic PIT
Depth three
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N. Kayal and S. Saraf.
Blackbox polynomial identity testing for depth 3 circuits.
In Proc. FOCS'09, 2009.
[ bib |
pdf ]
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Z.S. Karnin and A. Shpilka.
Black Box Polynomial Identity Testing of Generalized Depth-3
Arithmetic Circuits with Bounded Top Fan-In.
In Proc CCC'08, pages 280-291, 2008.
[ bib |
pdf ]
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Z. Dvir and A. Shpilka.
Locally decodable codes with 2 queries and polynomial identity
testing for depth 3 circuits.
In Proc. STOC'05, pages 592-601. ACM New York, NY, USA, 2005.
[ bib |
pdf ]
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N. Saxena and C. Seshadhri.
An Almost Optimal Rank Bound for Depth-3 Identities.
In Proc. CCC'09, pages 137-148. IEEE Computer Society, 2009.
[ bib |
pdf ]
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N. Kayal and S. Saxena.
Polynomial Identity Testing for Depth 3 Circuits.
In Proc CCC'06, pages 9-17, 2006.
[ bib |
pdf ]
Depth four
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Zohar S. Karnin, Partha Mukhopadhyay, Amir Shpilka, and Ilya Volkovich.
Deterministic identity testing of depth 4 multilinear circuits with
bounded top fan-in, 2009.
[ bib |
pdf ]
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N. Saxena.
Diagonal Circuit Identity Testing and Lower Bounds.
In Proc. ICALP'08, page 71. Springer-Verlag, 2008.
[ bib |
pdf ]
Probabilistic PIT
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R.A. DeMillo and R.J. Lipton.
A probabilistic remark on algebraic program testing.
Inf. Process. Lett., 7(4):193-195, 1978.
[ bib |
pdf ]
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J.T. Schwartz.
Fast probabilistic algorithms for verification of polynomial
identities.
J. ACM, 27(4):717, 1980.
[ bib |
pdf ]
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R. Zippel.
Probabilistic algorithms for sparse polynomials.
In Proc. EUROSAM, volume 79, pages 216-226. Springer, 1979.
[ bib |
pdf ]
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Richard J. Lipton.
The Curious History of the Schwartz-Zippel Lemma, 2009.
[ bib |
pdf ]
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Z.Z. Chen and M.Y. Kao.
Reducing Randomness Via Irrational Numbers.
SIAM J. Comput., 29(4):1247-1256, 2000.
[ bib |
pdf ]
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M. Agrawal and S. Biswas.
Primality and identity testing via Chinese remaindering.
In Proc. FOCS'99, pages 202-208, 1999.
[ bib |
pdf ]
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A.R. Klivans and D. Spielman.
Randomness efficient identity testing of multivariate polynomials.
In Proc. STOC'01, pages 216-223. ACM New York, NY, USA, 2001.
[ bib |
pdf ]
Misc.
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M. Bläser, M. Hardt, R.J. Lipton, and N.K. Vishnoi.
Deterministically testing sparse polynomial identities of unbounded
degree.
Information Processing Letters, 109(3):187-192, 2009.
[ bib |
pdf ]
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M. Agrawal and V. Vinay.
Arithmetic Circuits: A Chasm at Depth Four.
In Proc. FOCS'08, pages 67-75, 2008.
[ bib |
pdf ]
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E. Allender, J. Jiao, M. Mahajan, and V. Vinay.
Non-commutative arithmetic circuits: depth reduction and size lower
bounds.
Theoretical Computer Science, 209(1-2):47-86, 1998.
[ bib |
pdf ]
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V. Kabanets and R. Impagliazzo.
Derandomizing polynomial identity tests means proving circuit lower
bounds.
In Proc. FOCS'03, pages 355-364, 2003.
[ bib |
pdf ]
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Last modified: Jul 17, 2010